Home » Vision Systems from Mitutoyo Measure Multi-Levels Simultaneously
Vision Systems from Mitutoyo Measure Multi-Levels Simultaneously
February 14, 2005
The new Quick Image QI-2017RL and QL-30117Rl Serues 2-D vision measuring systems from Mitutoyo America Corp. employ a bi-lateral telecentric lens capable of focusing on multiple surface levels at the same time. The result is focusing effort, translating into error suppression and increased speed for higher measuring throughput.
According to the companys press release, the improved field of view (32 mm x 24 mm) and depth of field, the Mitutoyo Q1-2017/3017 systems can, in one view, completely capture images of workpieces with varying thickness and levels. Systems are able to simultaneously image features found on items such as tool edges, connectors,PCBs, cylinder forms and other solids with difficult level translations which conventional vision systems find difficult to measure. Continual refocusing is unnecessary, sharply reducing measurement error and increasing productivity.
The Quick Image Q1-2017/3017 high precision, mega pixel CCD color camera captures elevations and contours accurately for viewing, inspecton or analysis on a desktop PC or laptop.
Large XY travel ranges of 200 x 170 mm (QI-2017) and 300 x 170 mm (QI-3017), high maximum workpiece load and high efficiency optics enable the QI-2017/3017 to be productive across a wide range of low- to high-volume inspection applications.
QI-2017/3017 comes standard with QIPAK software enabling pattern matching inspection via a CAD-user template. QIPAK makes it easy to achieve repeatable, programmable measuring sequences, high evaluation speed and automatic report generation. With the optional MeasurLink module, measurements can be subjected to multiple statistical analyses.